Sachdev, Manoj <br/><br/>
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 

 - 2nd Ed. 
 - New Delhi  Springer  2010 
 - 328 p.  [F12] 
<br/><br/><label>ISBN: </label>9788184894295 
<br/><br/><label>Dewey Class. No.: </label>621.397  / SAC/DEF