TY  - BOOK
AU  - Sachdev, Manoj
AU  - Gyvez Jose Pineda de 
TI  - Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
SN  - 9788184894295
U1  - 621.397 
PY  - 2010///
CY  - New Delhi
PB  - Springer
ER  -