000			00336nam a22001217a 4500
999			_c3667 _d3667
020			_a0071134611
082			_a621.380287 _bLen/McG
100			_aLenk, John D., _9799
245			_aMcGraw-Hill Electronic Testing handbook _c John D. Lenk
260			_aNew York : _bMcGraw-Hill, Inc., _cc1994.
300			_axvii, 397 p.: _b[D3]
942			_cBOOK