| 000 | 00387nam a22001457a 4500 | ||
|---|---|---|---|
| 020 | _a9788184894295 | ||
| 082 |
_a621.397 _bSAC/DEF |
||
| 100 |
_aSachdev, Manoj _97667 |
||
| 245 | _aDefect-Oriented Testing for Nano-Metric CMOS VLSI Circuits | ||
| 250 | _a2nd Ed. | ||
| 260 |
_aNew Delhi _bSpringer _c2010 |
||
| 300 |
_a328 p. _b[F12] |
||
| 700 |
_aGyvez Jose Pineda de _97668 |
||
| 942 | _cBK | ||
| 999 |
_c6884 _d6884 |
||