000 00311nam a22001217a 4500
020 _a9788184890297
082 _a621.38
_bGRO/INT
100 _aGrout,Ian A.,
_97718
245 _aIntegrated Circuit Test Engineering
_bModern Techniques
260 _aNew Delhi
_bSpringer
_c2006
300 _a362p.
_b[D1]
942 _cBK
999 _c6916
_d6916