Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Sachdev, Manoj
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - 2nd Ed. - New Delhi Springer 2010 - 328 p. [F12]
9788184894295
621.397 / SAC/DEF
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - 2nd Ed. - New Delhi Springer 2010 - 328 p. [F12]
9788184894295
621.397 / SAC/DEF