Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Record no. 6884)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00387nam a22001457a 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9788184894295 |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.397 |
| Item number | SAC/DEF |
| 100 ## - MAIN ENTRY--AUTHOR NAME | |
| Personal name | Sachdev, Manoj |
| 245 ## - TITLE STATEMENT | |
| Title | Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 2nd Ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | New Delhi |
| Name of publisher | Springer |
| Year of publication | 2010 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | 328 p. |
| Other physical details | [F12] |
| 700 ## - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Gyvez Jose Pineda de |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | BOOKS |
| Withdrawn status | Lost status | Damaged status | Not for loan | Collection code | Permanent Location | Current Location | Shelving location | Date acquired | Source of acquisition | Cost, normal purchase price | Full call number | Accession Number | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Electronics | Don Bosco Institute of Technology Library | Don Bosco Institute of Technology Library | 22/09/2016 | The Corporate Book World | 599.00 | 621.397 SAC/DEF | 17219 | 22/09/2016 |