Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

By: Sachdev, Manoj Contributor(s): Gyvez Jose Pineda de Material type: Text

TextPublication details: New Delhi Springer 2010 Edition: 2nd EdDescription: 328 p. [F12]ISBN: 9788184894295DDC classification: 621.397

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Holdings
Item type	Current library	Collection	Call number	Status	Date due	Barcode
	Don Bosco Institute of Technology Library	Electronics	621.397 SAC/DEF (Browse shelf(Opens below))	Available		17219

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